Epitaxial oxide transistor
AssigneeSilanna UV Technologies Pte Ltd
InventorPetar Atanackovic
Life of this patent
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Abstract
The techniques described herein relate to a transistor including a substrate including sapphire, an epitaxial channel layer on the substrate, and an epitaxial gate layer on the channel layer. The epitaxial channel layer can include α-Ga2O3, with a first bandgap. The epitaxial gate layer can include an oxide material with a second bandgap, wherein the second bandgap is wider than the first bandgap. The transistor can also include electrical contacts, including: a source electrical contact coupled to the epitaxial channel layer; a drain electrical contact coupled to the epitaxial channel layer; and a gate electrical contact coupled to the epitaxial gate layer.
Claims20
A transistor, comprising:
- a substrate comprising sapphire;
- an epitaxial channel layer on the substrate, the epitaxial channel layer comprising α-Ga2O3 with a first bandgap;
- an epitaxial gate layer on the epitaxial channel layer, the epitaxial gate layer comprising an oxide material with a second bandgap, wherein the second bandgap is wider than the first bandgap;
- and
- electrical contacts comprising:
- a source electrical contact coupled to the epitaxial channel layer;
- a drain electrical contact coupled to the epitaxial channel layer;
- and
- a gate electrical contact coupled to the epitaxial gate layer.
Dependencies are inferred from the claim text.