Charge-coupled transistor with different-dielectric-thickness structure
AssigneesTaiwan Semiconductor Manufacturing Company, Ltd., National Taiwan University
InventorsJenn-Gwo Hwu, Tzu-Hao Chiang
Life of this patent
Estimating the term…
Loading patent…
AssigneesTaiwan Semiconductor Manufacturing Company, Ltd., National Taiwan University
InventorsJenn-Gwo Hwu, Tzu-Hao Chiang
Estimating the term…
A device includes a substrate, a dielectric structure, a gate electrode, and a drain electrode. The dielectric structure is over the substrate. The dielectric structure includes a first portion, a second portion, and a third portion. The first portion has a first equivalent oxide thickness. The second portion is spaced apart from the first portion and has a second equivalent oxide thickness. The third portion laterally surrounds the first and second portions and has a third equivalent oxide thickness greater than the first equivalent oxide thickness of the first portion. The gate electrode is over the dielectric structure and in contact with the first and third portions of the dielectric structure. The drain electrode is over the dielectric structure and in contact with the second and third portions of the dielectric structure.
A device comprising:
A device comprising:
A method, comprising:
Dependencies are inferred from the claim text.