System and method for improving safety of integrated circuits

A latch-up detection method comprising:

• generating, by a plurality of wells of a memory circuit of an integrated circuit (IC), a plurality of input signals, wherein a first input signal of the plurality of input signals is generated by a first well of the plurality of wells;
• periodically scanning, by a detection circuit of the IC, based on a select signal, the plurality of wells, wherein the select signal is indicative of a location of each well of the plurality of wells;
• selecting, by the detection circuit, the first input signal when the select signal indicates a first location of the first well;
• comparing, by the detection circuit, a level of the first input signal with a level of a threshold signal to generate a fault signal, wherein the threshold signal is indicative of a single event latch-up (SEL);
• and
• detecting, by the detection circuit, based on a first state of the fault signal, the SEL in the first well indicative of a fault in the memory circuit.