Analysis device and analysis method

An analysis device comprising:

• a memory storing a plurality of instructions;
• and
• a processor, wherein the plurality of instructions are configured to cause the processor to:
• acquire an image pair of a non-defective product image with a non-defective product as a first subject and a defective product image with a defective product as a second subject;
• extract an image region of a defective part of the defective product on a basis of the image pair;
• change a feature quantity of the image region of the defective part to generate a plurality of image regions of pseudo-defective parts;
• synthesize image regions of a plurality of pseudo-defective parts with the non-defective product image to generate a plurality of composite images having different feature quantities of the plurality of pseudo-defective parts;
• determine a label corresponding to each of the plurality of composite images, wherein:
• i) a non-defective product label indicates that a product in an image is the non-defective product and ii) a defective product label indicates that the product in the image is the defective product;
• and
• display an object indicating the label corresponding to each of the plurality of composite images in an array based on feature quantities, wherein the array is a graph displayed on an output device for viewing by an operator.