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US 12,455,213 B2Granted
Measurement system having a capacitance probe and an optical probe
AssigneeRtx Corporation
InventorsEli Warren, Bryan J. Hackett
Life of this patent
Estimating the term…
Abstract
A measurement system is provided that includes a probe assembly. The probe assembly includes a capacitance probe and an optical probe. The capacitance probe includes a capacitance sensor that forms a sensor face of the probe assembly. An aperture projects axially through the capacitance sensor to the sensor face. The optical probe is configured with an optical line of sight through the aperture into a volume adjacent the sensor face.
Claims20
A measurement system, comprising:
- a probe assembly including a capacitance probe and an optical probe;
- the capacitance probe comprising a capacitance sensor that forms a sensor face of the probe assembly, wherein an aperture projects axially through the capacitance sensor to the sensor face;
- and
- the optical probe configured with an optical line of sight through the aperture into a volume adjacent the sensor face.
1 more element
A measurement system, comprising:
- a blade tip clearance measurement system comprising a first probe, the first probe comprising a first probe sensor that forms a sensor face, wherein an aperture projects axially through the first probe sensor to the sensor face;
- and
- a blade time of arrival measurement system comprising a second probe, the second probe projecting through the aperture to a volume adjacent the sensor face.
A measurement system, comprising:
- a probe assembly including a capacitance probe, an optical probe and a housing structure;
- the capacitance probe comprising a capacitance sensor housed within the housing structure;
- and
- the optical probe comprising an optical fiber, and an end portion of the optical fiber housed with the capacitance sensor within the housing structure.
1 more element
Dependencies are inferred from the claim text.