Method, apparatus and system for measuring nonlinear correlation parameters of nonlinear device

Abstract

A method, an apparatus and a system to measure nonlinear correlation parameters of a nonlinear device, a processor to, perform band-stop filtering on a signal to be measured to generate a notch signal, and calculate a first nonlinear correlation parameter of the nonlinear device when the signal to be measured is transmitted according to a first output signal of the nonlinear device after the notch signal is input into the nonlinear device; calculate gain compression correction coefficients according to a second output signal of the nonlinear device after the first input signal is input into the nonlinear. The first input signal and the signal to be measured may have identical power and different signal probability distribution. The processor is to correct the first nonlinear correlation parameter according to the gain compression correction coefficients to obtain a second nonlinear correlation parameter of the nonlinear device when the signal to be measured is transmitted.

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