Near-infrared cut filter and imaging apparatus

A near-infrared cut filter, comprising:

• a transparent substrate having a first surface and a second surface opposite to each other;
• and
• a dielectric multilayer film positioned on a first surface side of the transparent substrate and configured to reflect light within a wavelength range from 700 nm to 750 nm,
• wherein the near-infrared cut filter has a mean transmittance T1 of 20% or less, a mean reflectance R1 of 80% or less, and a mean transmittance T2 of 65% or more, where the mean transmittance T1 is a mean regular transmittance within a wavelength range of 700 nm to 750 nm and is measured when light is incident in a normal direction from a second surface side of the transparent substrate, the mean reflectance R1 is a mean regular reflectance within a wavelength range of 700 nm to 750 nm and is measured when light is incident at an angle of 5° with respect to the normal direction from the second surface side of the transparent substrate, and the mean transmittance T2 is a mean regular transmittance within a wavelength range of 600 nm to 680 nm and is measured when light is incident in the normal direction from the second surface side of the transparent substrate.