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US 12,444,767 B2Granted
Negative active material for rechargeable lithium battery, method of preparing the same and rechargeable lithium battery including the same
AssigneeSamsung SDI Co., Ltd.
InventorsSang-Eun Park, Young-Ugk Kim
Life of this patent
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Abstract
A negative active material for a rechargeable lithium battery includes a core including a SiO2 matrix and a Si grain, and a coating layer continuously or discontinuously coated on the core. The coating layer includes SiC and C, and the peak area ratio of the SiC (111) plane to the Si (111) plane as measured by X-ray diffraction analysis (XRD) using a CuKα ray ranges from about 0.01 to about 0.5.
Claims20
A negative active material for a rechargeable lithium battery, comprising:
- a core comprising a Si grain in a SiO2 matrix;
- and
- a coating layer on at least a portion of the core, the coating layer comprising carbon,
- wherein in the core of the negative active material, amounts of the SiO2 matrix and the Si grain are sufficient to yield an oxygen and silicon content represented by SiOx in which 1≤x≤1.2, and
- wherein the coating layer comprises SiC, with a peak area ratio of the SiC (111) plane to the Si (111) plane as measured by X-ray diffraction analysis using a CuKα ray in a range from about 0.1 to about 0.5.
2 more elements
A rechargeable lithium battery comprising:
- a positive electrode comprising a positive electrode active material;
- an electrolyte comprising a non-aqueous organic solvent;
- a separator;
- and
- a negative electrode comprising a negative active material comprising:
- a core comprising a Si grain in a SiO2 matrix;
- and
- a coating layer on at least a portion of the core, the coating layer comprising carbon,
- wherein in the core of the negative active material, amounts of the SiO2 matrix and the Si grain are sufficient to yield an oxygen and silicon content represented by SiOx in which 1≤x≤1.2, and wherein the coating layer comprises SiC, with a peak area ratio of the SiC (111) plane to the Si (111) plane as measured by X-ray diffraction analysis using a CuKα ray in a range from about 0.1 to about 0.5.
6 more elements
Dependencies are inferred from the claim text.