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US 12,443,085 B2Granted
Counter electrode for electrochromic devices
AssigneeView Operating Corporation
InventorsDane Gillaspie, Sridhar K. Kailasam, Robert T. Rozbicki
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Abstract
The embodiments herein relate to electrochromic stacks, electrochromic devices, and methods and apparatus for making such stacks and devices. In various embodiments, an anodically coloring layer in an electrochromic stack or device is fabricated to include nickel tungsten tantalum oxide (NiWTaO). This material is particularly beneficial in that it is very transparent in its clear state.
Claims16
An integrated deposition system for fabricating an electrochromic device stack, the system comprising:
- a plurality of deposition stations aligned in series and interconnected and operable to pass a substrate from one station to the next without exposing the substrate to an external environment, wherein the plurality of deposition stations comprise
- (i) a first deposition station containing one or more material sources for depositing a cathodically coloring layer;
- (ii) a second deposition station containing one or more material sources for depositing an anodically coloring layer comprising nickel tungsten tantalum oxide, wherein the nickel tungsten tantalum oxide has an atomic ratio of Ni:(W+Ta) that is between 1.8:1 and 3:1, and has an atomic ratio of W:Ta that is between 1:1 and 2:1;
- and
- a controller containing program instructions for passing the substrate through the plurality of deposition stations in a manner that deposits on the substrate (i) the cathodically coloring layer, and (ii) two or more sub-layers of the anodically coloring layer to form a stack comprising at least the cathodically coloring layer and the anodically coloring layer, wherein the two or more sub-layers have different compositions and/or different relative concentration, and wherein a first sub-layer of the two or more sub-layers comprises a binary metal oxide and a second sub-layer of the two or more sub-layers comprises a ternary metal oxide.
2 more elements
A structure comprising:
- a first sub-layer comprising a binary metal oxide;
- a second sub-layer comprising a ternary metal oxide comprising nickel, tungsten, tantalum, and oxygen, wherein the second sub-layer comprises an atomic ratio of Ni:(W+Ta) that is between about 1.8:1 and 3:1, and
- an atomic ratio of W:Ta that is between about 1:1 and 2:1.
Dependencies are inferred from the claim text.