Measurement method and apparatus, and radiation measuring device

A measurement method for measuring a mass parameter of a workpiece being measured, the method comprising:

• determining a measured mass parameter of the workpiece being measured based on radiation intensity of rays that have passed through the workpiece being measured;
• and
• correcting the measured mass parameter using a displacement function of the workpiece being measured in a measurement environment, to obtain the corrected mass parameter of the workpiece being measured, wherein the displacement function is used to characterize influence of environmental factors on radiation in the measurement environment and is obtained by:
• demarcating at least two demarcation pieces in the measurement environment to obtain a mass calibration curve of the measurement environment, the mass calibration curve of the measurement environment being used to characterize a relationship between measured mass parameters of the at least two demarcation pieces measured in the measurement environment and predetermined nominal mass parameters of the at least two demarcation pieces;
• demarcating the at least two demarcation pieces in a standard environment to obtain a mass calibration curve of the standard environment, the mass calibration curve of the standard environment being used to characterize a relationship between measured mass parameters of the at least two demarcation pieces measured in the standard environment and the predetermined nominal mass parameters of the at least two demarcation pieces;
• fitting the mass calibration curve of the measurement environment with respect to the mass calibration curve of the standard environments to obtain the displacement function.

A measurement apparatus, comprising:

• a measured mass parameter determining module configured to determine a measured mass parameter of a workpiece being measured based on radiation intensity of rays that have passed through the workpiece being measured;
• and
• a mass parameter correction module configured to correct the measured mass parameter using a displacement function of the workpiece being measured in a measurement environment, to obtain the corrected mass parameter of the workpiece being measured, wherein the displacement function is used to characterize influence of environmental factors on radiation in the measurement environment and is obtained by:
• obtaining measured mass parameters of at least two demarcation pieces measured based on radiation intensity of rays that have passed through the at least two demarcation pieces;
• and
• solving for parameter values of an initial function according to the measured mass parameters of the at least two demarcation pieces and actual mass parameters of the at least two demarcation pieces to obtain the displacement function.