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US 12,442,632 B2Granted
Optical diffraction tomography microscope
AssigneeNanolive SA
InventorsSebastien Equis, Yann Cotte, Pierre-Alain Cotte
Life of this patent
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Abstract
Optical diffraction tomography microscope (2) comprising an illumination system (4) configured for transmitting a sample beam through a sample observation zone, a detection system (8) comprising at least one image sensor (54), and a wave collection system (6) comprising a lens (16) downstream of the sample observation zone configured for directing the sample beam towards the at least one image sensor.
Claims56
An optical diffraction tomography microscope, comprising:
- an illumination system;
- and
- a wave collection system including a lens and a holographic detection system, wherein
- the illumination system comprises a plurality of static sample illumination beam sources arranged around a sample observation zone of the illumination system within which a sample container is positionable,
- the plurality of static sample illumination beam sources are configured to emit sample illumination beams at a beam inclination angle (β) with respect to a center axis (A) extending through the sample observation zone,
- the plurality of static sample illumination beam sources are connected to a light generator configured to switch from one beam source to the next to generate a moving sample illumination beam around the sample observation zone, and
- the holographic detection system is configured to capture a plurality of holograms generated by interference of said sample illumination beams with reference beams generated by the holographic detection system.
4 more elements
An optical diffraction tomography microscope, comprising:
- an illumination system;
- and
- a wave collection system including a lens and a detection system, wherein
- the illumination system comprises a plurality of static sample illumination beam sources arranged around a sample observation zone of the illumination system within which a sample container is positionable,
- the plurality of static sample illumination beam sources are configured to emit sample illumination beams at a beam inclination angle (β) with respect to a center axis (A) extending through the sample observation zone,
- the plurality of static sample illumination beam sources are connected to a light generator configured to switch from one beam source to the next to generate a moving sample illumination beam around the sample observation zone, and wherein
- the illumination system comprises wave guides having wave guide outlets held in a wave guide support positioned around the sample observation zone configured to direct sample illumination beams at said beam inclination angle, and the wave guides are formed within a wave guide support that houses the lens of the wave collection system.
4 more elements
An optical diffraction tomography microscope, comprising:
- an illumination system;
- and
- a wave collection system including a lens and a detection system, wherein
- the illumination system comprises a plurality of static sample illumination beam sources arranged around a sample observation zone of the illumination system within which a sample container is positionable,
- the plurality of static sample illumination beam sources are configured to emit sample illumination beams at a beam inclination angle (β) with respect to a center axis (A) extending through the sample observation zone,
- the plurality of static sample illumination beam sources are connected to a light generator configured to switch from one beam source to the next to generate a moving sample illumination beam around the sample observation zone, and wherein
- the light sources of the illumination system comprise a plurality of wave guides positioned around the wave collection systems, coupled at an inlet end to the light generator configured to sequentially switch from one wave guide to the next to generate said rotating sample illumination beam around the sample observation zone.
4 more elements
An optical diffraction tomography microscope, comprising:
- an illumination system;
- and
- a wave collection system including a lens and a detection system, wherein
- the illumination system comprises a plurality of static sample illumination beam sources arranged around a sample observation zone of the illumination system within which a sample container is positionable,
- the plurality of static sample illumination beam sources are configured to emit sample illumination beams at a beam inclination angle (β) with respect to a center axis (A) extending through the sample observation zone,
- the plurality of static sample illumination beam sources are connected to a light generator configured to switch from one beam source to the next to generate a moving sample illumination beam around the sample observation zone, and wherein
- the wave collection system comprises a central obscuration, wherein a ratio d1/d2 of a diameter d1 of the central obscuration relative to a diameter of an aperture d2 of the lens is in a range of 5% to 95%, preferably in a range of 30% to 90%, and more preferably in a range of 50% to 80%.
4 more elements
Dependencies are inferred from the claim text.