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US 12,439,611 B2Granted
Memory cell and memory array select transistor
AssigneeZeno Semiconductor, Inc.
InventorsJin-Woo Han, Yuniarto Widjaja
Life of this patent
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Abstract
A semiconductor metal-oxide-semiconductor field effect transistor (MOSFET) with increased on-state current obtained through a parasitic bipolar junction transistor (BJT) of the MOSFET. Methods of operating the MOSFET as a memory cell or a memory array select transistor are provided.
Claims20
A semiconductor memory array comprising:
- a plurality of semiconductor devices configured to function as a memory select transistor with increased on-state drain current;
- wherein each of said semiconductor devices comprises:
- a substrate having a first conductivity type selected from p-type conductivity type and n-type conductivity type;
- a buried layer having a second conductivity type selected from said p-type conductivity type and said n-type conductivity type and being different from said first conductivity type;
- a body having said first conductivity type;
- a source region and a drain region each having said second conductivity type and being separated by said body;
- a gate positioned in between said source region and said drain region;
- a charge trap layer containing a substantial number of charge trap centers that may absorb excess majority carrier, said charge trap layer contacting at least one of said source region and said drain region;
- and
- an insulating layer comprising an STI contacting said charge trap layer;
- wherein said semiconductor device is configured to function as a select transistor for at least one memory element connected to said drain region or said source region, wherein a state of said at least one memory element is determined by a resistivity of said at least one memory element.
8 more elements
Dependencies are inferred from the claim text.