Methods and systems of scanning microwave vibration and deformation measurement

A scanning method for measuring microwave vibration and deformation, comprising the following steps:

• step S1:
• simultaneously transmitting linear-frequency-modulation continuous waves by using a plurality of transmit antennas, performing a phase shift control on transmit signals of the plurality of transmit antennas, and enabling a main lobe of a synthesized beam to be directed towards a measured specific angle direction;
• step S2:
• receiving echoes by using a plurality of receive antennas to obtain multi-channel baseband signals, and performing a non-linear demodulation processing on the acquired multi-channel baseband signals to obtain vibration and deformation displacement values of a single target or point for inspection in an angle direction 1 of a cycle or obtain vibration and deformation displacement values of a plurality of targets or points for inspection in the angle direction 1 of the cycle;
• step S3:
• offsetting an angle of the main lobe of the synthesized beam through the phase shift control on the plurality of transmit antennas, and extracting vibration and deformation displacement values of a single target or point for inspection in an angle direction 2 of the cycle based on the foregoing method or vibration and deformation displacement values of a plurality of targets or points for inspection in the angle direction 2 of the cycle;
• according to a measurement requirement, measuring and extracting vibration and deformation displacement values of a single target or point for inspection in another angle direction of the cycle or measuring and extracting vibration and deformation displacement values of a plurality of targets or points for inspection in the another angle direction of the cycle;
• and
• step S4:
• according to the foregoing scanning method, at intervals of a specific cycle time, measuring vibration and deformation through circular scanning in angle directions, to obtain vibration and deformation displacement time sequence values of all scanned points or targets for inspection.