Manufacture of power MOSFETs
AssigneeGeneSiC Semiconductor Inc.
InventorsSiddarth Sundaresan, Ranbir Singh, Jaehoon Park
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AssigneeGeneSiC Semiconductor Inc.
InventorsSiddarth Sundaresan, Ranbir Singh, Jaehoon Park
Estimating the term…
An embodiment relates to a method obtaining a silicon carbide wafer comprising a first conductivity type substrate and a first conductivity type drift layer, forming a second conductivity type first well region within the first conductivity type drift layer, forming a first conductivity type source region within the second conductivity type first well region, forming a second conductivity type plug region under the first conductivity type source region, forming a gate oxide layer, forming a patterned gate metal layer, depositing an interlevel dielectric (ILD) layer, forming a first patterned mask layer on top of the ILD layer, and etching the ILD layer and the first conductivity type source region using the first patterned mask layer, and forming a silicide layer, wherein the silicide layer is in contact with a vertical sidewall of the first conductivity type source region and at-least one second conductivity type region.
A semiconductor device comprising a unit cell, the unit cell comprising:
Dependencies are inferred from the claim text.