Charged particle detector
AssigneeHamamatsu Photonics K.K.
InventorMasahiro Hayashi
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AssigneeHamamatsu Photonics K.K.
InventorMasahiro Hayashi
Estimating the term…
A charged particle detector includes a microchannel plate having an input surface having electrons (charged particles) input thereon, a multiplication portion performing multiplication of electrons while maintaining positional information of the electrons, and an output surface outputting electrons multiplied by the multiplication portion; a multi-dynode having a plurality of dynodes multiplying the electrons output from the output surface, and insulation regions positioned between the dynodes; and an anode disposed in a spatial region between the output surface and the multi-dynode, and having collection portions for collecting electrons multiplied by the dynodes and aperture portions for allowing electrons output from the output surface to pass therethrough to the dynodes side. All of the insulation regions overlap the collection portions when viewed in an output direction of the electrons from the output surface.
A charged particle detector comprising:
Dependencies are inferred from the claim text.