Detecting hardware errors
AssigneeAmazon Technologies, Inc.
InventorsTom Kolan, Adi Habusha, Nicolas Worms, Ilan Wachtel
Life of this patent
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AssigneeAmazon Technologies, Inc.
InventorsTom Kolan, Adi Habusha, Nicolas Worms, Ilan Wachtel
Estimating the term…
Hardware errors can be detected by generating a plurality of test templates to perform testing on an integrated circuit (IC) device. A set of random tests can be generated corresponding to the plurality of test templates. The set of random tests can be executed on the IC device for multiple passes, and the results of the multiple passes can be compared to detect the hardware error in the IC device. The set of random tests can be generated as a binary image for execution on the IC device. The IC device may include multiple processing cores, and executing the multiple passes may include changing logical role of each processing core between subsequent passes. The set of random tests can be executed in a bare-metal mode, or at an application level of the IC device.
A method for detecting hardware errors in an integrated circuit (IC) device that includes a plurality of processing cores, comprising:
A computer-implemented method, comprising:
A non-transitory computer readable medium having stored therein instructions that, when executed by one or more processors, cause the one or more processors to perform operations including:
Dependencies are inferred from the claim text.