Adjustable supporting device

An adjustable supporting device configured to support a test circuit module, wherein the test circuit module comprises a carrier and a plurality of contact points disposed on the carrier, and the contact points are configured to test an electrical property of a semiconductor element, and the adjustable supporting device comprises:

• a circuit board having a first opening;
• a first fixing module disposed on the circuit board and having a second opening, wherein the test circuit module is fixed on the circuit board through the first fixing module, the test circuit module is electrically connected to the circuit board, and the contact points face the semiconductor element;
• an adjusting module disposed on the first fixing module and having a third opening;
• a second fixing module disposed on the adjusting module;
• and
• a supporting base positioned in the first opening, the second opening, and the third opening and abutting against the second fixing module and the carrier of the test circuit module, the supporting base comprises a first portion, a second portion, a third portion, and a fourth portion, the first portion abuts against the second fixing module, the second portion is connected to the third portion, the third portion is connected to the fourth portion, the fourth portion abuts against the carrier of the test circuit module, and the first portion and the second portion adjust a parallelism between the test circuit module and the semiconductor element through contact, thereby adjusting a horizontal flatness of the contact points.