Standard sample and manufacturing method thereof
AssigneeNTT Advanced Technology Corporation
InventorsAkira Kodaira, Takashi Maruyama, Satoshi Oku
Life of this patent
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AssigneeNTT Advanced Technology Corporation
InventorsAkira Kodaira, Takashi Maruyama, Satoshi Oku
Estimating the term…
A substrate (101) is etched by etching processing with crystal anisotropy, thereby forming a recess (104) from the main surface of the substrate (101) to the inside of the substrate (101). A side surface (105) is almost a (111) plane, and the etching hardly progresses. As a result, a cross section of the recess (104) perpendicular to the longitudinal direction has a rectangular shape. Since an opening (103) of a mask pattern (102) has a rectangular shape in a planar view, the opening of the recess (104) has a rectangular shape in a planar view, and the recess (104) is formed into, for example, a rectangular parallelepiped shape. The recess (104) includes a side surface (105) that forms one plane perpendicular to the main surface of the substrate (101). The side surface (105) is a facet surface and is a tilting surface tilted from the (111) plane.
A standard sample used to evaluate a microscope capable of performing observation in a nanometer size, including a scanning probe microscope, comprising:
A manufacturing method of a standard sample used to evaluate a microscope capable of performing observation in a nanometer size, including a scanning probe microscope, comprising:
Dependencies are inferred from the claim text.