Back to results
US 12,422,362 B2Granted
Apparatuses, systems, and methods for sample testing
AssigneeHand Held Products, Inc.
InventorsAdam Dewey McBrady, Chen Feng, Moin Shafai, Suresh Venkatarayalu
Life of this patent
Estimating the term…
Abstract
Methods, apparatuses, and systems associated with a sample testing device are provided. For example, an example sample testing device may include a substrate layer defining a bottom surface of the sample testing device, as well as a waveguide disposed on the substrate layer and includes at least one reference channel and at least one sample channel.
Claims20
A sample testing device comprising:
- a waveguide comprising a plurality of flow channels;
- a pump configured to deliver a buffer solution to a first flow channel of the plurality of flow channels through a first valve;
- a first buffer loop connecting the first flow channel of the plurality of flow channels to a second flow channel of the plurality of flow channels through a second valve;
- and
- a second buffer loop connecting the second flow channel of the plurality of flow channels to a third flow channel of the plurality of flow channels through a third valve, wherein a length of the first buffer loop is different from a length of the second buffer loop.
2 more elements
Dependencies are inferred from the claim text.