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US 12,422,361 B2Granted
Apparatuses, systems, and methods for sample testing
AssigneeHand Held Products, Inc.
InventorsChen Feng, Suresh Venkatarayalu, Robert Timothy Kester
Life of this patent
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Abstract
Methods, apparatuses, and systems associated with a sample testing device are provided. For example, an example sample testing device may include a substrate layer defining a bottom surface of the sample testing device, as well as a waveguide disposed on the substrate layer and includes at least one reference channel and at least one sample channel.
Claims6
A computer-implemented method comprising:
- triggering a light source calibration event associated with a light source component;
- capturing reference interference fringe data representing a reference interference fringe pattern in a sample environment, the reference interference fringe pattern projected via a reference channel of a waveguide, wherein the waveguide comprises a sample channel;
- comparing the reference interference fringe data with stored calibration interference data to determine a refractive index offset between the reference interference fringe data and the stored calibration interference data;
- tuning the light source component based on the refractive index offset;
- receiving first interference fringe data for an unidentified sample medium, the first interference fringe data associated with a first wavelength;
- receiving second interference fringe data for the unidentified sample medium, the second interference fringe data associated with a second wavelength;
- deriving refractive index curve data based on the first interference fringe data associated with the first wavelength and the second interference fringe data associated with the second wavelength;
- determining an operating temperature associated with the unidentified sample medium;
- querying a refractive index database based on at least the refractive index curve data and the operating temperature to determine a sample identity data, wherein the refractive index database stores a plurality of known refractive index curves associated with a plurality of identified samples and corresponding temperature data;
- and
- determining the sample identity data based on a match between the refractive index curve data and stored refractive index curves at the operating temperature.
8 more elements
Dependencies are inferred from the claim text.