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US 12,422,360 B2Granted
Apparatuses, systems, and methods for sample testing
AssigneeHand Held Products, Inc.
InventorsChen Feng, Moin Shafai, Suresh Venkatarayalu
Life of this patent
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Abstract
Methods, apparatuses, and systems associated with a sample testing device are provided. For example, an example sample testing device may include a substrate layer defining a bottom surface of the sample testing device, as well as a waveguide disposed on the substrate layer and includes at least one reference channel and at least one sample channel.
Claims19
A sample sensing device comprising:
- a waveguide holder component, wherein a first surface of the waveguide holder component comprises at least one alignment feature;
- a waveguide component comprising at least one etched edge;
- and
- wherein the at least one alignment feature comprises at least one protrusion on the first surface of the waveguide holder component, wherein the at least one protrusion is configured to align the waveguide component to allow media to flow through a plurality of flow channels within the waveguide component, wherein, when in an alignment arrangement, the at least one etched edge of the waveguide component is configured to be in contact with the at least one protrusion of the at least one alignment feature of the waveguide holder component.
1 more element
Dependencies are inferred from the claim text.