Aluminum nitride plate
AssigneeNGK Insulators, Ltd.
InventorsYoshimasa Kobayashi, Hiroharu Kobayashi
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AssigneeNGK Insulators, Ltd.
InventorsYoshimasa Kobayashi, Hiroharu Kobayashi
Estimating the term…
An aluminum nitride plate satisfies both of a “relation 1: c1>97.5%” and a “relation 2: c2/c1<0.995” where c1 is a c-plane degree of orientation that is defined as a ratio of a diffraction intensity of (002) plane to a sum of the diffraction intensity of (002) plane and a diffraction intensity of (100) plane when the surface layer of the aluminum nitride plate is subjected to an X-ray diffraction measurement, and c2 is a c-plane degree of (002) plane to the sum of the diffraction intensity of (002) plane and the diffraction intensity of (100) plane when a portion other than the surface layer of the aluminum nitride plate is subjected to the X-ray diffraction. Moreover, in the aluminum nitride plate, a difference in nitrogen content between the surface layer and the portion other than the surface layer is less than 0.15% in weight ratio.
An aluminum nitride plate, wherein
Dependencies are inferred from the claim text.