Apparatus and methods for x-ray imaging
AssigneeXenselab, LLC
InventorYing Zhao
Life of this patent
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AssigneeXenselab, LLC
InventorYing Zhao
Estimating the term…
An x-ray apparatus and method can improve x-ray imaging in a variety of ways. For example, the improve x-ray apparatus can reduce scatter from x-ray images acquired by two-dimensional detectors. An improved 2D x-ray apparatus can provide 3D imaging for medical and/or industrial applications. An improved 2D x-ray apparatus and method can produce separate material imaging, and composition analysis for characterization and correlation of image, densitometry, and composition information of individual component or individual material within a single subject. Non-rotational 3D microscopy, combining 2D or 3D full field x-ray imaging and high resolution 2D or 3D x-ray microscopy or spectral absorptiometry and spectroscopy can achieve a higher resolution and wider field of view in x-ray imaging and quantitative analysis in 3D and real time. The x-ray apparatus can improve tracking and/or surgical guidance in time and/or space.
An x-ray measurement system comprising:
Dependencies are inferred from the claim text.