Processing method
AssigneeDisco Corporation
InventorsAtsushi Komatsu, Koichi Makino
Life of this patent
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AssigneeDisco Corporation
InventorsAtsushi Komatsu, Koichi Makino
Estimating the term…
A cutting method that measures heights of an outer periphery of a wafer, calculates height distribution data, and then calculates change rates of the heights of the outer periphery of the wafer. Based on results of a comparison between the height change rates and a threshold, the cutting method determines whether or not foreign matter exists on a back surface of the wafer (i.e., whether or not foreign matter exists on a holding surface of a chuck table). The existence of foreign matter on the holding surface can hence be detected appropriately. If foreign matter exists on the holding surface, a worker is notified, and the cutting operation is cancelled. Therefore, the cutting method can appropriately give notification to the worker that foreign matter is stuck on the holding surface, and can also appropriately avoid performing cutting processing with foreign matter stuck on the holding surface.
A cutting apparatus for cutting a chamfered outer peripheral portion of a workpiece, comprising:
A cutting method for cutting a chamfered outer peripheral portion of a workpiece, the method comprising:
Dependencies are inferred from the claim text.