Self-diagnosis circuit and semiconductor device

Abstract

A self-diagnosis circuit (BST1) configured to diagnose a fault detection circuit (20) including a first comparator (CMP1) configured to be fed with a voltage based on a fault sensing target voltage (Vo1) and a first reference voltage (Vref1) includes a voltage switch circuit (50) configured to switch the level of a voltage based on a second reference voltage (Vref2) and output the resulting voltage, a first path switch circuit (51) configured to switch between a path through which the voltage output from the voltage switch circuit is fed to the first comparator and a path through which the voltage based on the fault sensing target voltage is fed to the first comparator, and a control circuit (15) configured to control the voltage switch circuit and the path switch circuit.

Dependencies are inferred from the claim text.