Apparatus for detecting defects of reflective element

An apparatus for detecting defects, comprising:

• a first conveyor for transporting a plurality of finished reflective elements;
• an image processor;
• a 3D inspection zone including a second conveyor disposed rearward of the first conveyor, a first robot for picking one of the finished reflective elements and placing same on the second conveyor, two spaced side-lit panels at either side of the second conveyor, and two first CCD-based digital cameras each disposed between the side-lit panels of the same side for taking 3D images of the finished reflective element moving on the second conveyor and sending the 3D images to the image processor for detecting defects of the finished reflective element;
• a 2D inspection zone including a third conveyor disposed rearward of the second conveyor for receiving the finished reflective element from the second conveyor, a backlit panel at either side of the third conveyor, and two second CCD-based digital cameras each disposed above the backlit panel for taking 2D images of the finished reflective element moving on the third conveyor and sending the 2D images to the image processor for detecting defects of the finished reflective element;
• a microcontroller for receiving data of the detected defects of the finished reflective element from the image processor and determining whether the finished reflective element has defects or not;
• a fourth conveyor disposed rearward of the third conveyor;
• a fifth conveyor disposed rearward of the third conveyor and being parallel to the fourth conveyor;
• and
• a second robot controlled by the microcontroller for picking the finished reflective element moving on the third conveyor and either placing same on the fourth conveyor if the finished reflective element is defect free or placing same on the fifth conveyor if the finished reflective element has defects.