Hybrid mass spectrometry apparatus
AssigneeAnalytik Jena AG
InventorsRoland Lehmann, Iouri Kalinitchenko
Life of this patent
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Abstract
The present disclosure includes a mass spectrometry apparatus for analyzing an analyte sample, which comprises: an ion source from which a quantity of analyte ions from the analyte sample may be sourced for providing an ion beam; a mass analyzer serving to filter the analyte ions of the ion beam based on their mass-to-charge ratio; a first detector unit for analyzing the ions of the ion beam; and a second detector unit being based on the time-of-flight principle and comprising a second detector for analyzing the ions of the ion beam. The present disclosure further includes a method for analyzing an analyte sample using a mass spectrometry apparatus according to the present disclosure.
Claims14
A mass spectrometry apparatus for analyzing an analyte sample, the mass spectrometry apparatus comprising:
- an ion source configured to generate a quantity of ions from the analyte sample as to provide an ion beam;
- a mass analyzer configured to filter the ions of the ion beam based on mass-to-charge ratio of the ions;
- a first detector unit configured to analyze the ions of the ion beam;
- a second detector unit configured to operate on the time-of-flight principle and comprising a second detector configured to analyze the ions of the ion beam,
- wherein the first detector unit is arranged parallel to a first plane, and the second detector unit is arranged parallel to a second plane;
- and
- a first guiding optics arranged and/or configured as to direct the ion beam received from the mass analyzer in a first flow direction parallel to the first plane to the first detector unit and/or in a second flow direction parallel to the second plane to the second detector unit,
- wherein the first flow direction and the second flow direction are antiparallel to each other.
Dependencies are inferred from the claim text.