Devices and methods for measuring the amount of frequency modulation
AssigneeNippon Telegraph and Telephone Corporation
InventorsTatsuya Okamoto, Daisuke Iida, Yusuke Koshikiya, Nazuki Honda
Life of this patent
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Abstract
The present disclosure relates to a frequency modulation amount measuring device that measures an optical spectral shift of scattered light at a position in an optical transmission line, and calculates a frequency modulation amount at the position, using the measured optical spectral shift.
Claims6
A frequency modulation amount measuring device, comprising a processor and a non-transitory computer readable medium storing a program, wherein execution of the program causes the processor to perform operations comprising:
- measuring an optical spectral shift of scattered light at a position to be analyzed in an optical transmission line, and
- calculating a frequency modulation amount at the position to be analyzed, using the measured optical spectral shift.
A frequency modulation amount measuring method comprising:
- measuring an optical spectral shift of scattered light at a position to be analyzed in an optical transmission line, and
- calculating a frequency modulation amount at the position to be analyzed, using the measured optical spectral shift.
Dependencies are inferred from the claim text.