Spectroscopic analysis system and spectroscopic analysis method
AssigneeHitachi High-Tech Analysis Corporation
InventorsAkihiro Nojima, Yusuke Kaga, Takuya Kambayashi, Jun Horigome, Kai Maruyama
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AssigneeHitachi High-Tech Analysis Corporation
InventorsAkihiro Nojima, Yusuke Kaga, Takuya Kambayashi, Jun Horigome, Kai Maruyama
Estimating the term…
A spectroscopic analysis system includes: an operation panel configured to receive an input of at least one of an upper limit value of a measurement period of a spectroscopic analysis spectrum or a lower limit value of measurement accuracy as a user setting condition related to measurement of the spectroscopic analysis spectrum of a sample; and a control unit configured to derive a predetermined recommended measurement condition that satisfies the user setting condition and cause a display unit to display the recommended measurement condition, in which the recommended measurement condition is at least one of a wavelength range of light to be used for measurement of the spectroscopic analysis spectrum, a sampling interval of a wavelength of the light, a slit width of a diffraction grating of a spectroscope that disperses the light, or a sweep speed of the wavelength of the light.
A spectroscopic analysis system comprising:
A spectroscopic analysis system comprising:
A spectroscopic analysis method comprising:
Dependencies are inferred from the claim text.