Pixel-diversity nanoparticle detection by interferometric reflectance imaging sensor

An interferometric reflectance imaging system for detection of nanoparticles comprising:

• an imaging sensor comprising pixels that are configured to be diverse in sensitivity to a plurality of light components, the pixels including a first type of pixels configured to be sensitive to a first component of the plurality of light components, the pixels including a second type of pixels configured to be sensitive to a second component of the plurality of light components;
• an illumination source configured to emit illumination light along an illumination path, the illumination light comprising the plurality of light components;
• and
• a target comprising a target substrate configured to support one or more nanoparticles on a surface of the target substrate, the target configured to receive the illumination light from the illumination path and reflect light along a collection path toward the imaging sensor,
• wherein the system is configured to:
• generate an image at the imaging sensor based, at least in part, on the light reflected from the target interfering with light scattered from nanoparticles on the target substrate;
• and
• process the image to detect the nanoparticles on the target substrate based, at least in part, on a variance between light collected by the first type of pixels and light collected by the second type of pixels.