Structures for three-terminal memory cells
AssigneeGlobalfoundries Singapore Pte. Ltd.
InventorsDesmond Jia Jun Loy, Eng Huat Toh, Shyue Seng Tan
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AssigneeGlobalfoundries Singapore Pte. Ltd.
InventorsDesmond Jia Jun Loy, Eng Huat Toh, Shyue Seng Tan
Estimating the term…
The disclosed subject matter relates generally to structures for use in memory devices. More particularly, the present disclosure relates to three terminal resistive random-access (ReRAM) memory structures having source, drain, and control electrodes. The present disclosure provides a memory structure including a source electrode, a drain electrode, a control electrode laterally between the source electrode and the drain electrode, a hole generating layer above the control electrode, a dielectric channel layer above the hole generating layer, the dielectric channel layer contacts the source electrode and the drain electrode, a first spacer layer on a first side of the control electrode, and a second spacer layer on a second side of the control electrode. The first spacer layer and the second spacer layer isolate the source electrode and the drain electrode from the control electrode and the hole generating layer.
A memory structure comprising:
A memory structure comprising:
A memory structure comprising:
Dependencies are inferred from the claim text.