US 12,387,313 B2 · Artificial intelligence driven automated atomic manipulation

Abstract

Typical atomic manipulation techniques require long fabrication times and are not readily scalable due to necessary input from an operator. A method and system for performing automated atomic manipulation is described. The method includes obtaining an image of an atomic manipulation surface for fabricating an atomic structure thereon. A processor performs image processing and determines a movable elements, and defects, in the image of the atomic manipulation surface. The processor further determines respective positions of each of the movable elements, and forbidden regions of the atomic manipulation surface, each forbidden region determined from the determined defects. A fabrication design plan is then determined from the positions of the movable elements, and forbidden regions.

Claims16

Dependent claims

A method for performing automated atomic manipulation, the method comprising:

obtaining, by an imaging sensor, a surface image of an atomic manipulation surface;
determining, by a processor and from the surface image, a plurality of candidate features of the atomic manipulation surface, each candidate feature being one of a movable atom or a defect, and each candidate feature being in a respective region of the image of the surface;
identifying, by the processor, which of the plurality of candidate features are movable nanoelements;
identifying, by the processor, respective positions of each of the movable nanoelements;
identifying, by the processor, which of the plurality of candidate features are defects;
identifying, by the processor, one or more forbidden regions, wherein each of the one or more forbidden regions contains an identified defect, and wherein each forbidden region is indicative of a region of the surface that is not to be traversed by a probe tip of a scanning probe microscope.

3 more elements

A system for performing atomic scale manipulation, the system comprising:

a scanning microscope, the scanning microscope having a scanning probe that provides electrostatic manipulation of positions of atoms on a surface;
a processor configured to execute machine readable instructions;
and
a non-transitory computer-readable memory having machine readable instructions stored thereon, that when executed by the processor, cause the system to:
obtain, by the scanning microscope, a surface image of a surface having movable naoelements and defects;
identify, by the processor, a plurality of movable nanoelements and positions of each movable nanoelement on the surface;
identify, by the processor, a plurality of defects and a position of each defect on the surface;
identify, by the processor and from the plurality of defects, a plurality of forbidden regions, each forbidden region containing an identified defect, and wherein each forbidden region is indicative of a region of the surface that is not to be traversed by the scanning probe of the scanning microscope.

5 more elements

Dependencies are inferred from the claim text.

Artificial intelligence driven automated atomic manipulation

Life of this patent

Artificial intelligence driven automated atomic manipulation

Life of this patent

Abstract

Claims16