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US 12,385,855 B2Granted
X-ray imaging system and learned model production method
AssigneeShimadzu Corporation
InventorsHiroaki Tsushima, Ryuji Sawada
Life of this patent
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Abstract
An X-ray imaging system is configured to acquire first and second images from a teacher X-ray image including an inspection target. Discrimination information to discriminate at least one of an area of the inspection target in the first and second images, and an area of a defect part is acquired. Machine learning for producing a learned model is performed by using input teacher data sets based on the first and second images, and output teacher data sets based on the discrimination information.
Claims11
An X-ray imaging system comprising:
- an X-ray emitter configured to emit X-rays to an inspection target having a regular arrangement;
- an X-ray detector configured to detect the X-rays emitted from the X-ray emitter;
- an image generator configured to generate an X-ray image based on the X-rays that are detected by the X-ray detector;
- and
- a model producer configured to produce a learned model for analysis of the X-ray image generated by the image generator, wherein
- the model producer includes
- a cut-out image acquirer configured to acquire a first image that is cut out corresponding to a first part from a teacher X-ray image including the inspection target having a regular arrangement, and a second image that is cut out corresponding to a second part different from the first part from the teacher X-ray image;
- a discrimination information acquirer configured to acquire discrimination information to discriminate at least one of an area of the inspection target in the first and second images, and an area of a defect part included in the inspection target in the first and second images;
- and
- a learning performer configured to perform machine learning for producing the learned model by using input teacher data sets based on the first and second images, and output teacher data sets based on the discrimination information.
7 more elements
A learned model production method comprising:
- a step of acquiring a first image that is cut out corresponding to a first part from a teacher X-ray image corresponding to an X-ray image generated by irradiating an inspection target having a regular arrangement with X-rays, and a second image that is cut out corresponding to a second part different from the first part from the teacher X-ray image;
- a step of acquiring discrimination information to discriminate at least one of an area of the inspection target in the first and second images, and an area of a defect part included in the inspection target in the first and second images;
- and
- a step of performing machine learning for producing a learned model for analysis of the X-ray image by using input teacher data sets based on the first and second images, and output teacher data sets based on the discrimination information.
1 more element
Dependencies are inferred from the claim text.