Electron microscopy grids and high-resolution structural determination methods
AssigneesUniversiteit Gent, Universiteit Antwerpen, Imec Vzw
InventorsWouter Van Putte, Thomas Reichert, Jean-Pierre Timmermans
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AssigneesUniversiteit Gent, Universiteit Antwerpen, Imec Vzw
InventorsWouter Van Putte, Thomas Reichert, Jean-Pierre Timmermans
Estimating the term…
The invention provides in an electron microscopy grid, comprising: a perforated substrate; a support film on the perforated substrate; a mixture of different linker molecules according to Structure (I), wherein AG is an anchoring group, for anchoring the linker molecule to the solid support; BU is a binding unit, for binding to the analyte; L1 is a first linear linker section; L2 is a second linear linker section; α is the angle between the linear linker section L1 and the linear linker section L2; AS is an angled linker section, connecting the linear linker section L1 and the linear linker section L2. The invention further provides in method of structural determination of analytes, using such EM-grids.
An electron microscopy grid, comprising:
Dependencies are inferred from the claim text.