Transmit modulation testing
AssigneeSilicon Laboratories Inc.
InventorsAnant Verma, Rangakrishnan Srinivasan, Zhongda Wang
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AssigneeSilicon Laboratories Inc.
InventorsAnant Verma, Rangakrishnan Srinivasan, Zhongda Wang
Estimating the term…
Modulation testing separately enables slices of an analog varactor array of an LC oscillator. For each enabled slice, a reference voltage supplying a resistor ladder is set to a plurality of different reference voltage values. Resistor ladder voltages generated for the different reference voltage values are supplied to the enabled slice and a control voltage coupled to the enabled slice is swept for each of the reference voltage values. Respective frequencies of an oscillator signal coupled to an output of the LC oscillator are measured for each enabled slice for each combination of the reference voltage values and the control voltage values. The linearity of LC oscillator gain is determined for each of the reference voltage values for each slice based on the respective frequencies and the control voltage values. Passing/failing the modulation testing is based on the linearity of the LC oscillator gain.
An apparatus comprising:
An apparatus comprising:
Dependencies are inferred from the claim text.