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US 12,372,496 B2Granted
Methods of measuring harvested crop material
AssigneeAGCO Corporation
InventorsFriedrich Robert Honeyman, Kevin J. Hamilton, Brian Busenitz
Life of this patent
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Abstract
A method of measuring a harvested crop includes measuring a first attribute of a first electric field in a first volume containing crop material, measuring a second attribute of a second electric field in a second volume containing crop material, and determining at least two different properties of the crop material based at least in part on the first attribute and the second attribute.
Claims14
A method of measuring a harvested crop, the method comprising:
- generating, via a measuring device comprising a plurality of electrodes, a first electric field having a first volume containing a first portion of a crop material;
- measuring a first attribute of the first electric field;
- changing one or more electrical connections of at least one electrode of the plurality of electrodes to change the at least one electrode from a grounded electrode to a source electrode;
- responsive to changing the one or more electrical connections of the at least one electrode of the plurality of electrodes, generate, via the measuring device, a second electric field having a second volume containing a second portion of the crop material;
- measuring a second attribute of the second electric field;
- and
- determining at least two different properties of the crop material based at least in part on the first attribute and the second attribute.
4 more elements
Dependencies are inferred from the claim text.