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US 12,372,464 B2Granted
Reflectivity measurement apparatus and method of measuring reflectivity therefor
AssigneeMelexis Technologies SA
InventorsJos Rennies, Luc Buydens
Life of this patent
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AssigneeMelexis Technologies SA
InventorsJos Rennies, Luc Buydens
Estimating the term…
In a heating appliance comprising a substrate for receiving an item of cookware, a method of measuring reflectivity comprises emitting a time-varying electromagnetic signal from a first side of the substrate, a portion of the time-varying electromagnetic signal propagating through the substrate. Electromagnetic radiation is then received at the first side of the substrate, the received electromagnetic radiation comprising a background ambient component received and a component reflected by the substrate. A gain factor is applied to translate the received electromagnetic radiation to a receive electrical signal. An offset signal component is then identified from the receive electrical signal, the offset signal component arising from the background ambient component of the received electromagnetic radiation. The gain factor from the offset signal component is then estimated using a characterisation of the offset signal component, and the reflectivity is calculated using the receive electrical signal and the estimated gain factor.
A method of measuring reflectivity in a heating appliance comprising a substrate for receiving an item of cookware, the method comprising:
A reflectivity measurement apparatus comprising:
Dependencies are inferred from the claim text.