Method for production quality control of flexible superconducting tapes
AssigneeUniversity of Houston System
InventorsJaroslaw Wosik, Jerzy Krupka, Venkat Selvamanickam
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Abstract
A method and apparatus for quality control of superconducting tapes, comprising non-destructive and non-contact methods for measuring the surface resistance of a superconducting tape during tape growth. The dielectric resonator techniques of the present invention can be adapted for measurements at the elevated temperatures used during annealing as well as at room and lower temperatures, providing the opportunity for real-time quality control of semiconductor tapes as they are being fabricated.
Claims10
A method for monitoring quality control superconducting parameters of a superconductor tape, comprising the steps of:
- a) bringing at least one measurement apparatus into communication with the superconducting tape, to produce at least one dielectric resonator;
- b) obtaining experimental measurements of Q-factor, Frequency, and resonant frequency of the dielectric resonator as a function of temperature at selected time intervals, wherein the temperature is maintained within a temperature range above a critical temperature of the superconductor tape;
- c) performing numerical simulations and parametric analysis to calculate models of Q-factor and resonant frequency as a function of sheet resistance or conductivity of the superconductor tape:
- d) mapping the experimental measurements of Q-factor or resonant frequency of the superconductor tape to the models of Q-factor or resonant frequency as a function of sheet resistance or conductivity
- e) determining a complex conductivity of the superconductor tape;
- and
- f) correlating the complex conductivity of the superconductor tape with quality control superconducting parameters of the superconductor tape.
Dependencies are inferred from the claim text.