Measurement system, and a method in relation to the measurement system

A measurement system configured to determine at least one apparatus parameter related to a working procedure of an apparatus involving movements, wherein said apparatus is one or more of a machine or a machine tool or a production equipment or an industrial robot, and wherein an apparatus parameter comprises performance insufficiencies, degradations, calibration parameters, geometric errors, thermal deformations, inertial load induced deformations or motion control errors of the apparatus,

• the system comprises:
• a processing unit and
• at least one measurement unit;
• wherein said at least one measurement unit is configured to be arranged at said apparatus and to measure movements related to the working procedure, said at least one measurement unit comprises at least one sensor member configured to measure at least accelerations, and to generate at least one sensor signal in dependence thereto, and to apply said signal(s) to said processing unit,
• wherein said at least one measurement unit is configured to be arranged at said apparatus such that the at least one measurement unit, during a measurement procedure, is repetitively moved in a loop, displaying a loop trajectory, in both directions of the loop, a forward direction along the loop trajectory, corresponding to a forward loop, and a backward direction along the loop trajectory, corresponding to a backward loop, such that, during the measurement procedure, multiple forward loops are executed, subsequently followed by executing multiple backward loops, and to perform measurements of at least accelerations during said measurement procedure,
• wherein said processing unit is configured to determine said at least one apparatus parameter of working procedure movements which are indicated in said measured at least accelerations, and only based upon said measured at least accelerations,
• and wherein said processing unit is configured to calculate a measure of said at least one apparatus parameter only based upon one or many parameters of said accelerations by applying a predetermined fit technique adapted to a type of the loop and modelling of an effect of errors on the measured acceleration.