Method for semiconductor device interface circuitry functionality and compliance testing

A method for determining a decoupling capacitance C of a device under test interface circuitry, the device under test interface circuitry located between automated testing equipment (ATE) and a device under test (DUT), comprising:

• disconnecting the DUT from the device under test interface circuitry;
• connecting a Device Under Testing Power Supply (DPS) resource as a DUT Power Supply to the device under test interface circuitry;
• setting a current clamp of the DPS resource to a test application level;
• turning off the DPS resource voltage and confirming a discharged state of zero volts;
• setting the DPS resource to a force voltage mode;
• setting the current clamp to a minimum current level and programming the DPS resource to output a predetermined low voltage level;
• turning on the output at time zero;
• waiting a period of time dt to allow the decoupling capacitance C to charge up from a fixed amount of current based on a current clamp level I;
• placing the DPS resource into a voltage measurement mode having high impedance;
• adding any delay time to the waiting of the period of time dt;
• measuring the voltage dv before the capacitance is fully charged;
• and
• determining the decoupling capacitance C.