Interleaved analog-to-digital converter (ADC) gain calibration
AssigneeAyDeeKay LLC
InventorsChristopher A. Menkus, Robert W. Kim
Life of this patent
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AssigneeAyDeeKay LLC
InventorsChristopher A. Menkus, Robert W. Kim
Estimating the term…
An integrated circuit may include a full-scale reference generation circuit that corrects for variation in the gain or full scale of a set of interleaved analog-to-digital converters (ADCs). Notably, the full-scale reference generation circuit may provide a given full-scale or reference setting for a given interleaved ADC, where the given full-scale setting corresponds to a predefined or fixed component and a variable component (which may specify a given full-scale correction for a given full scale). For example, the full-scale reference generation circuit may include a full-scale reference generator replica circuit that outputs a fixed current corresponding to the fixed component. Furthermore, the full-scale reference generation circuit may include a full-scale reference generator circuit that outputs a first voltage corresponding to the given full-scale setting based at least in part on the fixed current and a variable current that, at least in part, specifies the given full-scale correction.
An integrated circuit, comprising:
A system, comprising:
A method for generating full-scale reference voltages, comprising:
Dependencies are inferred from the claim text.