Apparatus and method for measuring dynamic on-resistance of nitride-based switching device

An apparatus for measuring dynamic on-resistance of a nitride-based device under test (DUT) comprising a control terminal connected to a controller being configured to generate a control signal to switch on and off the DUT, the apparatus comprising:

• an input interface comprising a first input node configured for being electrically connected to a first conduction terminal of the DUT, a second input node configured for being electrically connected to a second conduction terminal of the DUT;
• an output interface comprising a first output node configured for being electrically connected to a first signal input node of an electrical signal monitoring equipment and a second output node configured for being electrically connected to a second signal input node of the electrical signal monitoring equipment, the second output node being connected to the second input node;
• a first clamping module comprising a control terminal, a first conduction terminal electrically connected to the first input node, and a second conduction terminal electrically coupled to the first output node;
• a second clamping module comprising a control terminal, a first conduction terminal electrically connected to the first output node and a second conduction terminal electrically connected to the second output node;
• and
• a driving module comprising an input terminal electrically connected to the first input node, a first output terminal electrically connected to the control terminal of the first clamping module and a second output terminal electrically connected to the control terminal of the second clamping module;
• and
• wherein the driving module is configured to:
• sense a state change of the DUT;
• generate a first control signal to switch on and off the first clamping module based on the state change of the DUT and generate a second control signal to turn on the second clamping module before the first clamping module being turned on and turned off the second clamping module after the first clamping module being turned off such that an output voltage across the first and second output nodes is clamped to indicate a drain-source voltage of the DUT.

A method for measuring dynamic on-resistance of a nitride-based device under test (DUT) having a first conduction terminal, a second conduction terminal and a control terminal with an apparatus, the apparatus including a first clamping module, a second clamping module, a driving module, an input interface comprising a first input node configured for being electrically connected to a first conduction terminal of the DUT, a second input node configured for being electrically connected to a second conduction terminal of the DUT;

• and an output interface comprising a first output node configured for being electrically connected to a first signal input node of an electrical signal monitoring equipment and a second output node connected to the second input node and configured for being electrically connected to a second signal input node of the electrical signal monitoring equipment, the method comprising:
• connecting the control terminal of the DUT to an output of a controller;
• connecting the first input node to a first input of the driving module and a first conduction terminal of the first clamping module;
• connecting the second input node to a second input of the driving module;
• connecting a first output of the driving module to a control terminal of the first clamping module;
• connecting the first output node to a second conduction terminal of the first clamping module and a first conduction terminal of the second clamping module;
• connecting the second output node to a second conduction terminal of the second clamping module;
• and
• connecting the second input node to the second output node.