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US 12,352,729 B2Granted
Configurable materials testing
AssigneeTactun LLC
InventorsRafayel Ghasabyan, Arev Hambardzumyan, Vahe Momjyan
Life of this patent
Estimating the term…
Abstract
Techniques are described for configuring a materials test system to perform materials tests on sample material(s). Such a materials test system may include a test controller and materials test device(s), which are connected to the test controller. In an embodiment, the materials test system receives input selecting a test controller type for the test controller of the materials test system and input for configuring a materials test device. Without the materials test system being connected with the test controller and the materials test device, generating configuration data based on the inputs. The generated configuration data may be loaded into the test controller, thereby configuring the materials test system.
Claims20
A computer-implemented method comprising:
- configuring, at a materials test deployment system, a materials test system to perform one or more materials tests on one or more sample materials, the materials test system comprising a test controller device and one or more materials test devices, wherein the test controller device is communicatively coupled to the one or more materials test devices, the configuring comprising, without the materials test deployment system being communicatively coupled with the test controller device and with the one or more materials test devices:
- wherein at least one materials test device of the one or more materials test devices is associated with a plurality of available configuration setting values,
- wherein the test controller device is associated with a plurality of test controller hardware device types,
- wherein each test controller hardware device type of the plurality of test controller hardware device types indicates capabilities of a controller device of said test controller hardware device type, including compatibility of the controller device of said test controller hardware device type with configuration of the one or more materials test devices,
- receiving input selecting a particular test controller hardware device type, from the plurality of test controller hardware device types, for the test controller device,
- based at least in part on receiving the input selecting the particular test controller hardware device type, from the plurality of test controller hardware device types, for the test controller device, determining a particular subset of the plurality of available configuration setting values possible for configuring the at least one materials test device,
- displaying, for the at least one materials test device, the particular subset of the plurality of available configuration setting values to configure the at least one materials test device,
- receiving input for configuring the at least one materials test device of the one or more materials test devices, the input for configuring comprising one or more values from the particular subset of the plurality of available configuration setting values that are available for configuring the at least one materials test device and that are based on the input selection of the particular test controller hardware device type, from the plurality of test controller hardware device types, for the test controller device, and
- generating configuration data based at least in part on the input for configuring the at least one materials test device of the one or more materials test devices and the input selecting the particular test controller hardware device type;
- in response to receiving input to load the configuration data, loading the configuration data into the test controller device and thereby, at least in part, configuring the materials test system;
- receiving input for performing at least one materials test of the one or more materials tests thereby causing performance of the at least one materials test by the test controller device.
8 more elements
A system comprising one or more processors and one or more storage media storing one or more computer programs for execution by the one or more processors, the one or more computer programs configured to perform a method comprising:
- configuring, at a materials test deployment system, a materials test system to perform one or more materials tests on one or more sample materials, the materials test system comprising a test controller device and one or more materials test devices, wherein the test controller device is communicatively coupled to the one or more materials test devices, the configuring comprising, without the materials test deployment system being communicatively coupled with the test controller device and with the one or more materials test devices:
- wherein at least one materials test device of the one or more materials test devices is associated with a plurality of available configuration setting values,
- wherein the test controller device is associated with a plurality of test controller hardware device types,
- wherein each test controller hardware device type of the plurality of test controller hardware device types indicates capabilities of a controller device of said test controller hardware device type, including compatibility of the controller device of said test controller hardware device type with configuration of the one or more materials test devices,
- receiving input selecting a particular test controller hardware device type, from the plurality of test controller hardware device types, for the test controller device,
- based at least in part on receiving the input selecting the particular test controller hardware device type, from the plurality of test controller hardware device types, for the test controller device, determining a particular subset of the plurality of available configuration setting values possible for configuring the at least one materials test device,
- displaying, for the at least one materials test device, the particular subset of the plurality of available configuration setting values to configure the at least one materials test device,
- receiving input for configuring the at least one materials test device of the one or more materials test devices, the input for configuring comprising one or more values from the particular subset of the plurality of available configuration setting values that are available for configuring the at least one materials test device and that are based on the input selection of the particular test controller hardware device type, from the plurality of test controller hardware device types, for the test controller device, and
- generating configuration data based at least in part on the input for configuring the at least one materials test device of the one or more materials test devices and the input selecting the particular test controller hardware device type;
- in response to receiving input to load the configuration data, loading the configuration data into the test controller device and thereby, at least in part, configuring the materials test system;
- receiving input for performing at least one materials test of the one or more materials tests thereby causing performance of the at least one materials test by the test controller device.
8 more elements
Dependencies are inferred from the claim text.