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US 12,345,749 B2Granted
Device and method for measuring of the complex transfer function of an object
AssigneeTallinn University of Technology
InventorsPaul Annus, Raul Land, Mart Min, Olev Märtens, Marek Rist, Eiko Priidel
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Abstract
The invention is related to the field of measurement electronics and related to the measurement of complex transfer functions (e.g. of impedance), especially in the presence of large disturbances and for measuring of small changes of the characteristics of the object under test. The goals of the proposed invention are achieved by detuning of the excitation and reference signals, e.g. by adding incremental phase-shift to the excitation signal to generate the reference signal.
Claims9
A device for measuring a complex transfer function of an object, comprising:
- a generator comprising a first and a second direct digital synthesizers (DDSs), the first direct digital synthesizer (DDS) configured to generate an AC excitation signal to be introduced into an object and the second direct digital synthesizer (DDS) to generate an AC reference signal;
- a multiplier configured to multiply a response signal from the object and the AC reference signal from the generator;
- and
- a data processing unit connected to an output of the multiplier, wherein the generator is configured to generate the AC reference signal and the AC excitation signal during a measurement period, wherein the AC reference signal and the AC excitation signal coincide in phase at the beginning of said measurement period, and the AC reference signal has a discrete stepwise or a continuously increasing delay relative to the AC excitation signal during the measurement period until the AC excitation signal and the AC reference signal coincide again in phase at an end of the measurement period.
1 more element
Dependencies are inferred from the claim text.