Systems and methods for automated tip conditioning for scanning tunneling spectroscopy
AssigneeThe Regents of the University of California
InventorsShenkai Wang, Junmian Zhu, Raymond Blackwell, Felix Fischer
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AssigneeThe Regents of the University of California
InventorsShenkai Wang, Junmian Zhu, Raymond Blackwell, Felix Fischer
Estimating the term…
A scanning tunneling microscope including a z-axis scanning assembly; a quantum tunneling tip operatively connected to the z-axis scanning assembly; a z-axis controller configured to communicate with the z-axis scanning assembly; an x-y scanning assembly including a sample platform for holding a sample to be observed and arranged proximate the quantum tunneling tip separated in a z-axis direction from the platform; an x-y controller configured to communicate with the x-y scanning assembly; a measurement circuit connected to the quantum tunneling tip and the sample platform such that a relative electrical voltage is provided between said quantum tunneling tip and the sample platform and so as to measure an electrical current; and a data processor configured to communicate with the z-axis controller and the x-y controller to receive surface imaging information or point spectral information therefrom.
A scanning tunneling microscope, comprising:
A method for automated tip conditioning for a scanning tunneling microscope, comprising:
A computer-implemented method for automated tip conditioning for a scanning tunneling microscope, wherein the method is implemented in a computer system comprising one or more processors configured to execute one or more computer program modules, the method comprising:
Dependencies are inferred from the claim text.