Drive circuit with improved timing margin for memory device
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsMasaru Haraguchi, Yoshisato Yokoyama, Yorinobu Fujino
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsMasaru Haraguchi, Yoshisato Yokoyama, Yorinobu Fujino
Estimating the term…
Disclosed herein are related to a memory device. In one aspect, the memory device includes a drive circuit coupled to a first line and a second line. In one aspect, the drive circuit is configured to apply, according to a first control signal having a first state, a data signal to either one of the first line or the second line to write data at a memory cell. In one aspect, the memory device includes a pre-charge circuit configured to set, according to a second control signal having a second state, voltages at the first line and the second line to a predetermined voltage level. In one aspect, the memory device includes an equalizer configured to electrically decouple the first line from the second line, according to the first control signal having the first state and the second control signal having the second state.
A memory device comprising:
A memory device comprising:
A method comprising:
Dependencies are inferred from the claim text.