Inspection system and inspection method for secondary battery
AssigneeKabushiki Kaisha Toshiba
InventorKazuyoshi Ueda
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Abstract
According to one embodiment, an inspection system for a secondary battery includes an image sensor, a detector, and an inspection processor. The image sensor captures an image of a fiber layer of an electrode structure of a secondary battery. The electrode structure includes an electrode and the fiber layer formed on a surface of the electrode. The electrode includes a current collector and an active material layer. The detector detects a color in data of the image captured with the image sensor. The inspection processor inspects a pinhole defect in the fiber layer based on the color detected with the detector.
Claims5
An inspection system for a secondary battery, the inspection system comprising:
- an image sensor configured to capture an image of a fiber layer of an electrode structure of a secondary battery, the electrode structure comprising an electrode and the fiber layer formed on a surface of the electrode, the electrode comprising a current collector and an active material layer;
- a detector configured to detect a color in data of the image captured with the image sensor;
- and
- an inspection processor configured to inspect a pinhole defect in the fiber layer based on the color detected with the detector, wherein
- the image captured with the image sensor includes a first region of the electrode and a second region of the fiber layer, and
- the inspection processor is configured to:
- set the second region as an inspection region;
- and
- detect a pinhole region having an active-material-layer color of the active material layer in the image in the inspection region, as the pinhole defect,
- the image sensor is configured to scan the electrode structure line by line to capture the image, and
- the inspection processor is configured to:
- set an overlapping region at a boundary between consecutive first and second images obtained by the image sensor;
- determine the pinhole region having the active-material-layer color detected in the overlapping region of the second image as not being the pinhole region of the pinhole defect with a condition where the pinhole region having the active-material-layer color in the overlapping region of the first image corresponds with the pinhole region having the active-material-layer color in the overlapping region of the second image;
- and
- detect, as the pinhole region having the active-material-layer color, a region in which a brightness of blue sub-pixels of the image in the inspection region is equal to or greater than a brightness of red and green sub-pixels.
An inspection method for a secondary battery, the method comprising:
- capturing an image of a fiber layer of an electrode structure of a secondary battery, the electrode structure comprising an electrode and the fiber layer formed on a surface of the electrode, the electrode comprising a current collector and an active material layer;
- detecting a color in data of the image;
- and
- inspecting a pinhole defect in the fiber layer based on the color detected in the data, wherein the image includes a first region of the electrode and a second region of the fiber layer;
- setting the second region as an inspection region;
- detecting a pinhole region having an active-material-layer color of the active material layer in the image in the inspection region, as the pinhole defect;
- scanning the electrode structure line by line to capture the image;
- setting an overlapping region at a boundary between consecutive first and second images;
- determining the pinhole region having the active-material-layer color detected in the overlapping region of the second image as not being the pinhole region of the pinhole defect with a condition where the pinhole region having the active-material-layer color in the overlapping region of the first image corresponds with the pinhole region having the active-material-layer color in the overlapping region of the second image;
- and
- detecting, as the pinhole region having the active-material-layer color, a region in which a brightness of blue sub-pixels of the image in the inspection region is equal to or greater than a brightness of red and green sub-pixels.
Dependencies are inferred from the claim text.