System-on-chip and method for performing a diagnosis during runtime
AssigneeDeepx Co., Ltd.
InventorLok Won Kim
Life of this patent
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AssigneeDeepx Co., Ltd.
InventorLok Won Kim
Estimating the term…
A system on chip (SoC) for testing a component in a system during runtime includes a plurality of functional components; a system bus for allowing the plurality of functional components to communicate with each other; one or more wrappers, each connected to one of the plurality of functional components; and an in-system component tester (ICT). The ICT monitors, via the wrappers, states of the functional components; selects, as a component under test (CUT), at least one functional component in an idle state; tests, via the wrappers, the selected at least one functional component; interrupts the testing step with respect to the selected at least one functional component, based on a detection of a collision with an access from the system bus to the selected at least one functional component; and allows a connection of the at least one functional component to the system bus, based on the interrupting step.
A system-on-chip (SoC), comprising:
A system, comprising
A method for diagnosing a system on chip (SoC) during runtime, the method comprising:
Dependencies are inferred from the claim text.