Inspection device and inspection method
AssigneePanasonic Intellectual Property Management Co., Ltd.
InventorsShozo Oshio, Mitsuru Nitta, Ryosuke Shigitani
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AssigneePanasonic Intellectual Property Management Co., Ltd.
InventorsShozo Oshio, Mitsuru Nitta, Ryosuke Shigitani
Estimating the term…
Provided is an inspection device including: a light source including a phosphor; and a photodetector, and detecting, using the photodetector, reflected light of the inspection light reflected by the inspection object. A spectral distribution of the inspection light has at least one maximum value derived from fluorescence emitted by the phosphor, and the maximum value is within a wavelength range of 600 nm or more and 750 nm or less. When Pmax is set as a spectral intensity at the maximum value where the spectral intensity is largest at the at least one maximum value, a largest value of the spectral intensity in a wavelength range longer than 750 nm is 20% or more of Pmax and less than Pmax, and the spectral intensity within a wavelength range of 500 nm or more and 550 nm or less is less than 20% of Pmax.
An inspection device comprising:
An inspection method, comprising:
Dependencies are inferred from the claim text.