Component measurement device, component measurement device set, and information processing method

An information processing method executed by a component measurement device comprising:

• a chip insertion space into which a component measurement chip is insertable, a light emitting unit configured to emit irradiation light to the component measurement chip in a state in which the component measurement chip is located in the chip insertion space, a light receiving unit configured to receive light that has passed through or has been reflected by the component measurement chip, and a control unit, the information processing method comprising, with the control unit:
• a step of calculating a ratio of (i) a received light intensity in the light receiving unit when irradiation light having a first wavelength is emitted from the light emitting unit to (ii) a received light intensity in the light receiving unit when irradiation light having a second wavelength is emitted from the light emitting unit;
• and a step of detecting abnormality of the component measurement chip on a basis of the calculated ratio.